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Design For Test

test facilitated in a product's design.

See Also: DFT, BIST


Showing results: 1321 - 1335 of 1406 items found.

  • Space Flight Components

    Atec, Inc.

    A tec, Inc. specializes in the design, manufacture, and integration of complex test systems and quality critical components. Our production engineering expertise separates us from other manufacturing companies when both reliability and cost are important. Atec has the best in 5 to 9 Axis CNC machining, coordinate measuring machines (CMMs), 3D additive metal and plastic printers, 9-Axis capable waterjet, cryogenic liquid flow test benches and environmental test chambers. We can deliver to the tightest tolerances and most exacting requirements. We can advise our customers on electron beam welding, friction joining, electronic test, environmental test, acoustics, vibration and many other technologies that can reduce manufacturing and operating costs. We are currently manufacturing liquid rocket engine fuel and oxidizer valves for multiple launch vehicles and have participated in 158 consecutive launch successes. Atec manufactured and tested advanced lithium-ion battery adapter plates that manage power for the International Space Station. Atec is designing, manufacturing, and testing power flow modules that work to prevent system failure on the human crew capsule (CCTS) that will transport astronauts to/from the ISS. Atec was awarded NASA  Agency-Level Small Business Subcontractor of the Year , SBA Region VI Subcontractor of the Year for our support to NASA and Boeing and we were named a DCMA Top 500 Supplier.

  • AC Fuel Flow Signal Generator

    TA-100 - Tech-Aid Products

    The TA-100 signal generator was designed to facilitate testing of aircraft fuel flow indicators that require two input signals designated as “Drum” and “Impeller”. This generator provides both signals so as to provide a direct interface to the fuel flow indicator under test. The generator also provides switched power out to the unit under test as well as a 5v source for testing the bezel lighting. The original design was built around the requirements for the AMETEK series indicators (pn: 10171 series). This generator simulates a reference and a time delayed signal of appropriate amplitude for an indication of up to 1200pph for the indicator under test. The “PPH Select” switch provides fixed signal delays representing 0, 200, 400, 800, 1000 and 1200pph flow rates respectively, this provides the mechanic with an expedient check of the indicators accuracy. The “PPH Adjust” control allows the mechanic to vary the signal delay throughout the full range and serves as a good method for checking of pointer smoothness from stop to stop. The unit’s front panel also provides test jacks to monitor the “FDR Output” as well as the drum and impeller signals. The TA-100 requires only 28Vdc to operate. This generator provides a very economical approach to any repair facility or flight department as it becomes an alternative to purchasing two bench top signal generators. The TA-100 generator at the very least can provide a simple functional test and eliminate the high cost of exchanging an indicator as a function of troubleshooting the aircraft system.

  • Programmable DC Power Supply

    IT6100B Series - I-TECH Electronic Co., Ltd

    IT6100B series (86 ~ 1200W) high speed high precision programmable DC power supply is withultra high voltage rising time, the fastestfull load up to 500us, resolution up to 0.1mV / 0.01mA, the latest output waveform priority mode allows rising waveform ofvoltage or current  is with high-speed and no overshoot, which is widely used inaerospace power modules and other high-precision test occasions. IT6100B hasbuilt-in standard USB / RS232 / GPIB communication interface and the panel supports List programming, which canprovide multi-purpose solutionaccording to customer design and testing demands, easy to use.

  • Loop / PFC Testers

    PeakTech Prüf- und Messtechnik GmbH

    The PeakTech 2715 is a loop tester which is used to test the safety of electrical systems. These device measures the impedance of the short-circuit loop between the outer conductors of a circuit, whereby the probable short-circuit current is calculated. The protection of the circuit (miniature circuit breaker) must therefore trigger at a lower current than the expected short-circuit current, in order to avoid excessive heating of the lines and thus a fire risk. The PeakTech 2715 is due to its function and its robust design almost indispensable when performing new installations, but also for general checking of electrical systems, this device is the ideal companion.

  • Meter Qualification Boards

    WECO 8020, 8030 - Radian Research, Inc.

    WECO Meter Qualification Boards by Radian Research enable extensive functional testing of single-phase and three-phase revenue grade electricity meters. Unlike Warm-up Boards and Load Boards that are limited to just powering the meter or applying a fixed current, WECO Meter Qualification Boards can test a variety of communications, disconnect and safety features. The WECO 8020 and 8030 have varying capabilities based on your requirements. They feature an innovative open socket design exclusive to RADIAN that ensures optimum operator safety. Capability, versatility and safety combine to make WECO Meter Qualification Boards THE logical choice.

  • PCI-6289, 32 AI (18-Bit, 625 kS/s), 4 AO (2.8 MS/s), 48 DIO PCI Multifunction I/O Device

    779111-01 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO (2.8 MS/s), 48 DIO PCI Multifunction I/O Device - The PCI‑6289 offers analog I/O, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Hybrid, Multifunction I/O Module

    779630-01 - NI

    32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6229 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module

    779115-01 - NI

    32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6229 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PCI-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device

    779546-01 - NI

    80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6255 offers analog I/O, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6289, 32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module

    779123-01 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6289 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6225, 80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module

    779296-01 - NI

    80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXI‑6225 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    780054-01 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    780053-04 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    780053-01 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module

    779121-01 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXI‑6281 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

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